Publication:

Vacuum UV spectroscopic ellipsometry applied to the characterization of high-k gate dielectrics

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

2186 since deposited on 2021-10-15
424item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations

Metrics

Views

2186 since deposited on 2021-10-15
424item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations