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Advances and challenges in ultra low-k patterning
Publication:
Advances and challenges in ultra low-k patterning
Date
2012
Meeting abstract
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xu, Kaidong
;
Souriau, Laurent
;
Lazzarino, Frederic
;
de Marneffe, Jean-Francois
;
Baklanov, Mikhaïl
;
Boullart, Werner
Journal
Abstract
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1990
since deposited on 2021-10-20
Acq. date: 2025-10-22
Citations
Metrics
Views
1990
since deposited on 2021-10-20
Acq. date: 2025-10-22
Citations