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Characterization and optimization of CD control for 0.25µm CMOS applications
Publication:
Characterization and optimization of CD control for 0.25µm CMOS applications
Date
1996
Proceedings Paper
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1409.pdf
541.68 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ronse, Kurt
;
Op de Beeck, Maaike
;
Yen, Anthony
;
Kim, Kee - Ho
;
Van den hove, Luc
Journal
Abstract
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1889
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1889
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations