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Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers
Publication:
Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers
Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pinardi, Kuntjoro
;
Jain, Uma
;
Jain, Suresh
;
Maes, Herman
;
Van Overstraeten, Roger
;
Willander, M.
Journal
Journal of Applied Physics
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1994
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations
Metrics
Views
1994
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations