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Evaluation of optical material parameters for advanced absorbers on EUV masks
Publication:
Evaluation of optical material parameters for advanced absorbers on EUV masks
Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Scholze, Frank
;
Laubis, Christian
;
Philipsen, Vicky
;
Luong, Vu
;
Edrisi, Arash
;
van de Kruijs, Robbert
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2051
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations
Metrics
Views
2051
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations