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Strain measurements in thin film structures by convergent beam electron diffraction
Publication:
Strain measurements in thin film structures by convergent beam electron diffraction
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Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Armigliato, A.
;
Balboni, R.
;
Benedetti, A.
;
Frabboni, S.
;
Tixier, A.
;
Vanhellemont, Jan
Journal
Journal de Physique III
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1980
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations
Metrics
Views
1980
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations