Publication:

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Date

2014
Journal article
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dc.contributor.authorFleischmann, Claudia
dc.contributor.authorConard, Thierry
dc.contributor.authorHavelund, Rasmus
dc.contributor.authorFranquet, Alexis
dc.contributor.authorPoleunis, Claude
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorDelcorte, Arnaud
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.date.accessioned2021-10-22T01:29:19Z
dc.date.available2021-10-22T01:29:19Z
dc.date.issued2014
dc.identifier.issn0142-2421
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23821
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/sia.5621/abstract
dc.source.beginpage54
dc.source.endpage57
dc.source.issueS1
dc.source.journalSurface and Interface Analysis
dc.source.volume46
dc.title

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

dc.typeJournal article
dspace.entity.typePublication
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