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Interface and border traps in Ge-based gate stacks
Publication:
Interface and border traps in Ge-based gate stacks
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Date
2011
Proceedings Paper
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21711.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nyns, Laura
;
Lin, Dennis
;
Brammertz, Guy
;
Bellenger, Florence
;
Shi, Xiaoping
;
Sioncke, Sonja
;
Van Elshocht, Sven
;
Caymax, Matty
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1805
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Acq. date: 2025-12-16
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Metrics
Views
1805
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-16
Citations