Publication:

Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation – application to 6T SRAM

Date

2014
Proceedings Paper
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dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorKukner, Halil
dc.contributor.authorRoussel, Philippe
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-22T08:12:13Z
dc.date.available2021-10-22T08:12:13Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24808
dc.source.beginpage5D2
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.title

Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation – application to 6T SRAM

dc.typeProceedings paper
dspace.entity.typePublication
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