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Influence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs
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Influence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Souza, Marcio
;
Doria, R.T.
;
Simoen, Eddy
;
Martino, Joao
;
Claeys, Cor
;
Pavanello, Marcello
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1840
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Acq. date: 2025-12-12
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Views
1840
since deposited on 2021-10-21
3
last month
Acq. date: 2025-12-12
Citations