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Conference contributions
Multi-physics simulation and reliability analysis for RF-MEMS devices
Publication:
Multi-physics simulation and reliability analysis for RF-MEMS devices
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Date
2008-04
Proceedings Paper
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16225.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rottenberg, Xavier
;
Czarnecki, Piotr
;
Tilmans, Harrie
;
De Raedt, Walter
;
De Wolf, Ingrid
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1903
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations
Metrics
Views
1903
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations