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Model for the charge trapping in high permittivity gate dielectric stacks
Publication:
Model for the charge trapping in high permittivity gate dielectric stacks
Date
2001
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Naili, Mohamed
;
Heyns, Marc
;
Stesmans, Andre
Journal
Journal of Applied Physics
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1944
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1944
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations