Publication:
Stress induced leakage current in thin oxides and its impact on flash memory reliability
Date
| dc.contributor.author | De Blauwe, Jan | |
| dc.date.accessioned | 2021-09-30T11:38:58Z | |
| dc.date.available | 2021-09-30T11:38:58Z | |
| dc.date.issued | 1998-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2477 | |
| dc.title | Stress induced leakage current in thin oxides and its impact on flash memory reliability | |
| dc.type | PHD thesis | |
| dspace.entity.type | Publication | |
| Files | ||
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