Publication:

Impact of lateral charge migration on the retention performance of planar and 3D SONOS devices

Date

 
dc.contributor.authorMaconi, Alessadro
dc.contributor.authorArreghini, Antonio
dc.contributor.authorMonzio Compagnoni, Christian
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorSpinelli, Alessandro S.
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorLacaita, Andrea Leonardo
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-19T15:50:39Z
dc.date.available2021-10-19T15:50:39Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19352
dc.source.beginpage195
dc.source.conference41st European Solid-State Device Conference - ESSDERC
dc.source.conferencedate13/09/2011
dc.source.conferencelocationHelsinki Finland
dc.source.endpage198
dc.title

Impact of lateral charge migration on the retention performance of planar and 3D SONOS devices

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
22591.pdf
Size:
345.33 KB
Format:
Adobe Portable Document Format
Publication available in collections: