Publication:

Hot hole induced damage in 1T-FBRAM on bulk

Date

2011
Proceedings Paper
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dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorRakowski, Michal
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorAltimime, Laith
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorRakowski, Michal
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.date.accessioned2021-10-19T12:29:16Z
dc.date.available2021-10-19T12:29:16Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18481
dc.source.beginpage99
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate10/04/2011
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage104
dc.title

Hot hole induced damage in 1T-FBRAM on bulk

dc.typeProceedings paper
dspace.entity.typePublication
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