Publication:
Time dependent dielectric breakdown in thin oxides: mechanisms, statistics and oxide reliability prediction
Date
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-4609-5573 | |
| cris.virtualsource.department | 8b84673b-878f-4c3b-959d-b7cdae2d70d9 | |
| cris.virtualsource.orcid | 8b84673b-878f-4c3b-959d-b7cdae2d70d9 | |
| dc.contributor.advisor | Maes, H. | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.date.accessioned | 2021-09-30T11:47:24Z | |
| dc.date.available | 2021-09-30T11:47:24Z | |
| dc.date.issued | 1998-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2524 | |
| dc.title | Time dependent dielectric breakdown in thin oxides: mechanisms, statistics and oxide reliability prediction | |
| dc.type | PHD thesis | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |