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Articles
AFMs reveal 3-D semiconductor features
Publication:
AFMs reveal 3-D semiconductor features
Date
1995
Journal article
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573.pdf
419.65 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Peter
;
Chollet, Frederic
;
Vandervorst, Wilfried
Journal
Test and Measurement World
Abstract
Description
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2020
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2020
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations