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Diamond electrical probes with sub-nanometer spatial resolution for advanced nanoelectronics device characterization
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Diamond electrical probes with sub-nanometer spatial resolution for advanced nanoelectronics device characterization
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
Yeghoyan, Taguhi
;
Paredis, Kristof
;
Schulze, Andreas
;
Vandervorst, Wilfried
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Abstract
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1868
since deposited on 2021-10-23
Acq. date: 2025-12-15
Citations
Metrics
Views
1868
since deposited on 2021-10-23
Acq. date: 2025-12-15
Citations