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Probing semiconductor devices on the nanometer schale
Publication:
Probing semiconductor devices on the nanometer schale
Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Clarysse, Trudo
;
Trenkler, Thomas
;
Hantschel, Thomas
;
Eyben, Pierre
;
Haegeman, Bart
;
Stephenson, Robert
;
De Wolf, Peter
Journal
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1943
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1943
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-08
Citations