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Defect analysis in semiconductor materials based on p-n junction diode characteristics
Publication:
Defect analysis in semiconductor materials based on p-n junction diode characteristics
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Date
2007
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14911.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Vanhellemont, Jan
Journal
Defect and Diffusion Forum
Abstract
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1883
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Acq. date: 2025-12-16
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Metrics
Views
1883
since deposited on 2021-10-16
4
last month
Acq. date: 2025-12-16
Citations