Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Gate oxide atomic layer deposition studied by in situ infrared spectroscopy
Publication:
Gate oxide atomic layer deposition studied by in situ infrared spectroscopy
Date
2003
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Frank, M.M.
;
Dörmann, S.
;
Chabal, Y.J.
;
Sayan, S.
;
Garfunkel, E.
;
Wilk, G.D.
;
Green, M.L.
;
Delabie, Annelies
;
Brijs, Bert
Journal
Abstract
Description
Metrics
Views
1915
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1915
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations