Publication:
Read path degradation analysis in SRAM
Date
| dc.contributor.author | Agbo, Innocent | |
| dc.contributor.author | Taouil, Mottaqiallah | |
| dc.contributor.author | Hamdioui, Said | |
| dc.contributor.author | Weckx, Pieter | |
| dc.contributor.author | Cosemans, Stefan | |
| dc.contributor.author | Catthoor, Francky | |
| dc.contributor.author | Dehaene, Wim | |
| dc.contributor.imecauthor | Weckx, Pieter | |
| dc.contributor.imecauthor | Cosemans, Stefan | |
| dc.contributor.imecauthor | Catthoor, Francky | |
| dc.contributor.imecauthor | Dehaene, Wim | |
| dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
| dc.date.accessioned | 2021-10-23T10:04:18Z | |
| dc.date.available | 2021-10-23T10:04:18Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2016 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26273 | |
| dc.identifier.url | http://ieeexplore.ieee.org/document/7519325/ | |
| dc.source.beginpage | 1 | |
| dc.source.conference | 21th IEEE European Test Symposium - ETS | |
| dc.source.conferencedate | 23/05/2016 | |
| dc.source.conferencelocation | Amsterdam The Netherlands | |
| dc.source.endpage | 2 | |
| dc.title | Read path degradation analysis in SRAM | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |