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Dissertations
BTI analysis, monitoring and mitigation for nano scaled circuits
Publication:
BTI analysis, monitoring and mitigation for nano scaled circuits
Date
2013
Dissertation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Khan, Seyab
Journal
Abstract
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1880
since deposited on 2021-10-21
Acq. date: 2025-10-30
Citations
Metrics
Views
1880
since deposited on 2021-10-21
Acq. date: 2025-10-30
Citations