Publication:
Precise optical constant determination in the soft X-ray, EUV, and VUV spectral range
| dc.contributor.author | Abbasirad, Najmeh | |
| dc.contributor.author | Saadeh, Qais | |
| dc.contributor.author | Ciesielski, Richard | |
| dc.contributor.author | Gottwald, Alexander | |
| dc.contributor.author | Philipsen, Vicky | |
| dc.contributor.author | Makhotkin, Igor | |
| dc.contributor.author | Sokolov, Andrey | |
| dc.contributor.author | Kolbe, Michael | |
| dc.contributor.author | Scholze, Frank | |
| dc.contributor.author | Soltwisch, Victor | |
| dc.contributor.imecauthor | Philipsen, Vicky | |
| dc.contributor.orcidimec | Philipsen, Vicky::0000-0002-2959-432X | |
| dc.date.accessioned | 2024-04-17T09:36:20Z | |
| dc.date.available | 2023-07-28T17:40:05Z | |
| dc.date.available | 2024-04-17T09:36:20Z | |
| dc.date.embargo | 2023-03-31 | |
| dc.date.issued | 2023 | |
| dc.identifier.doi | 10.1117/12.2659369 | |
| dc.identifier.eisbn | 978-1-5106-6100-4 | |
| dc.identifier.isbn | 978-1-5106-6099-1 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42242 | |
| dc.publisher | SPIE-INT SOC OPTICAL ENGINEERING | |
| dc.source.beginpage | Art. 124963B | |
| dc.source.conference | Conference on Metrology, Inspection, and Process Control XXXVII | |
| dc.source.conferencedate | FEB 27-MAR 02, 2023 | |
| dc.source.conferencelocation | San Jose | |
| dc.source.journal | Proceedings of SPIE | |
| dc.source.numberofpages | 4 | |
| dc.source.volume | 12496 | |
| dc.title | Precise optical constant determination in the soft X-ray, EUV, and VUV spectral range | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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