A time- and frequency-domain characterization of a thin-film metamorphic HEMT under modulated backside illumination

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Author(s)

Vandersmissen, Raf

;

Schreurs, Dominique

;

Vandenberghe, Servaas

;

Borghs, Gustaaf

Journal

International Journal of RF and Microwave Computer-Aided Engineering

Metrics

1875 since deposited on 2021-10-15

Acq. date: 2025-10-23