Publication:
Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET
| dc.contributor.author | Wu, Zhicheng | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Truijen, Brecht | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Wu, Zhicheng | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Truijen, Brecht | |
| dc.contributor.imecauthor | Roussel, Philippe | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Truijen, Brecht::0000-0002-2288-1414 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
| dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.date.accessioned | 2022-05-06T09:52:11Z | |
| dc.date.available | 2021-11-02T16:00:30Z | |
| dc.date.available | 2022-05-05T08:28:40Z | |
| dc.date.available | 2022-05-06T09:52:11Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/TED.2021.3080657 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37838 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 3246 | |
| dc.source.endpage | 3253 | |
| dc.source.issue | 7 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 8 | |
| dc.source.volume | 68 | |
| dc.subject.keywords | ELECTRON-MOBILITY | |
| dc.subject.keywords | DEGRADATION | |
| dc.subject.keywords | SIMULATION | |
| dc.subject.keywords | VOLTAGE | |
| dc.subject.keywords | MODEL | |
| dc.title | Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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