Publication:

Next generation bulk FinFET devices and their benefits for ESD robustness

Date

2009

Proceedings Paper

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Files

17855.pdf 402.92 KB

Author(s)

Griffoni, Alessio

;

;

Russ, Christian

;

Trémouilles, David

;

Linten, Dimitri

;

;

Collaert, Nadine

;

Witters, Liesbeth

;

Meneghesso, Gaudentio

;

Groeseneken, Guido

Metrics

1972 since deposited on 2021-10-17

Acq. date: 2026-01-05