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A model study of the hot-carrier problem in LDD and overlapped LDD MOSFETs

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dc.contributor.authorHabas, Predrag
dc.contributor.authorBellens, Rudi
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-09-29T13:07:01Z
dc.date.available2021-09-29T13:07:01Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/667
dc.source.beginpage285
dc.source.endpage288
dc.source.journalMicroelectronic Engineering
dc.source.volume28
dc.title

A model study of the hot-carrier problem in LDD and overlapped LDD MOSFETs

dc.typeJournal article
dspace.entity.typePublication
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