Publication:
Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins
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| cris.virtual.orcid | 0000-0002-9940-0260 | |
| cris.virtual.orcid | 0000-0002-4609-5573 | |
| cris.virtual.orcid | 0000-0002-1484-4007 | |
| cris.virtual.orcid | 0000-0002-3614-9590 | |
| cris.virtual.orcid | 0000-0002-7382-8605 | |
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| cris.virtualsource.orcid | 54f24b6a-b745-4c59-a5bc-058756e94864 | |
| dc.contributor.author | Vici, A. | |
| dc.contributor.author | Pantisano, L. | |
| dc.contributor.author | Roussel, P. J. | |
| dc.contributor.author | Chasin, A. | |
| dc.contributor.author | Franco, J. | |
| dc.contributor.author | Kaczer, B. | |
| dc.contributor.author | Meric, I. | |
| dc.contributor.author | Ramey, S. M. | |
| dc.contributor.author | Degraeve, R. | |
| dc.contributor.author | Hicks, J. | |
| dc.date.accessioned | 2026-05-11T08:26:55Z | |
| dc.date.available | 2026-05-11T08:26:55Z | |
| dc.date.createdwos | 2025-10-18 | |
| dc.date.issued | 2025-10-06 | |
| dc.identifier.doi | 10.1109/ted.2025.3613295 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59396 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 5780 | |
| dc.source.endpage | 5792 | |
| dc.source.issue | 11 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 13 | |
| dc.source.volume | 72 | |
| dc.subject.keywords | MULTIPLE SOFT-BREAKDOWN | |
| dc.subject.keywords | GATE-OXIDE BREAKDOWN | |
| dc.subject.keywords | PROGRESSIVE BREAKDOWN | |
| dc.subject.keywords | STATISTICAL DISTRIBUTION | |
| dc.subject.keywords | VOLTAGE-DEPENDENCE | |
| dc.subject.keywords | THIN | |
| dc.subject.keywords | MODEL | |
| dc.subject.keywords | PREDICTION | |
| dc.subject.keywords | ACCURATE | |
| dc.subject.keywords | EVENTS | |
| dc.title | Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-04-07 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-04-07 | |
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