Publication:

Single microparticle characterization using multi-wavelength lens-free imaging

 
dc.contributor.authorMarien, Jasper
dc.contributor.authorJayapala, Murali
dc.contributor.authorLambrechts, Andy
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorYurt, Abdulkadir
dc.contributor.imecauthorMarien, Jasper
dc.contributor.imecauthorJayapala, Murali
dc.contributor.imecauthorLambrechts, Andy
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorYurt, Abdulkadir
dc.contributor.orcidimecMarien, Jasper::0000-0002-5090-5268
dc.contributor.orcidimecJayapala, Murali::0000-0001-7917-0149
dc.contributor.orcidimecLambrechts, Andy::0000-0001-7592-2999
dc.contributor.orcidimecVan Hoof, Chris::0000-0002-4645-3326
dc.contributor.orcidimecYurt, Abdulkadir::0000-0002-1413-6756
dc.date.accessioned2024-12-11T09:00:25Z
dc.date.available2024-05-04T17:57:00Z
dc.date.available2024-12-11T09:00:25Z
dc.date.embargo2024-03-11
dc.date.issued2024
dc.description.wosFundingTextWetenschappelijk (1S66718N) .
dc.identifier.doi10.1364/OPTCON.516373
dc.identifier.issn2770-0208
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43905
dc.publisherOptica Publishing Group
dc.source.beginpage399
dc.source.endpage412
dc.source.issue3
dc.source.journalOPTICS CONTINUUM
dc.source.numberofpages14
dc.source.volume3
dc.subject.keywordsMIE-SCATTERING
dc.subject.keywordsHOLOGRAPHIC MICROSCOPY
dc.subject.keywordsPIXEL SUPERRESOLUTION
dc.subject.keywordsCOLLOIDAL PARTICLES
dc.subject.keywordsRECONSTRUCTION
dc.subject.keywordsINDEX
dc.subject.keywordsLIGHT
dc.subject.keywordsSHOT
dc.subject.keywordsSIZE
dc.title

Single microparticle characterization using multi-wavelength lens-free imaging

dc.typeJournal article
dspace.entity.typePublication
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