Publication:

On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs

Date

 
dc.contributor.authorDos Santos, Sara
dc.contributor.authorNicoletti, Talitha
dc.contributor.authorMartino, Joao A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorVeloso, Anabela
dc.contributor.authorJurczak, Gosia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-21T07:22:30Z
dc.date.available2021-10-21T07:22:30Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22279
dc.source.beginpage444
dc.source.endpage450
dc.source.issue1
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume60
dc.title

On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: