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Conference contributions
Noise and tunnelling through the 2.5nm gate oxide in SOI MOSFETs
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Noise and tunnelling through the 2.5nm gate oxide in SOI MOSFETs
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Simoen, Eddy
;
Mercha, Abdelkarim
;
Claeys, Cor
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Acq. date: 2026-04-06
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Views
1811
since deposited on 2021-10-15
2
last month
Acq. date: 2026-04-06
Citations