Publication:
Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability
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1981 since deposited on 2021-10-29
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Acq. date: 2026-02-24
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Statistics
Views
1981 since deposited on 2021-10-29
1last month
1last week
Acq. date: 2026-02-24
Citations