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Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability
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1979 since deposited on 2021-10-29
2last month
1last week
Acq. date: 2026-01-08
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Views
1979 since deposited on 2021-10-29
2last month
1last week
Acq. date: 2026-01-08
Citations