Publication:
Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs
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33318 since deposited on 2021-09-29
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Acq. date: 2026-04-06
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Statistics
Views
33318 since deposited on 2021-09-29
3last month
1last week
Acq. date: 2026-04-06
Citations