Publication:
Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs
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33315 since deposited on 2021-09-29
1last month
Acq. date: 2026-01-26
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Statistics
Views
33315 since deposited on 2021-09-29
1last month
Acq. date: 2026-01-26
Citations