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Thermal stability extraction from single perpendicular MTJs and Mbit arrays: comparison and statistical analysis

Date

2016
Meeting abstract
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dc.contributor.authorVan Beek, Simon
dc.contributor.authorMartens, Koen
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKim, Woojin
dc.contributor.authorSwerts, Johan
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorThean, Aaron
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-23T15:51:51Z
dc.date.available2021-10-23T15:51:51Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27430
dc.source.conferenceMMM-Intermag
dc.source.conferencedate11/01/2016
dc.source.conferencelocationSan Diego, CA USA
dc.title

Thermal stability extraction from single perpendicular MTJs and Mbit arrays: comparison and statistical analysis

dc.typeMeeting abstract
dspace.entity.typePublication
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