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Probing dopant, carrier and impurity distributions in small 3D-structures and confined volumes with SIMS, Atomprobe Tomography, SSRM and C-AFM
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Probing dopant, carrier and impurity distributions in small 3D-structures and confined volumes with SIMS, Atomprobe Tomography, SSRM and C-AFM
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
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1823
since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations
Metrics
Views
1823
since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations