Publication:

Degradation mechanisms in Germanium Electro-Absorption Modulators

Date

2022
Proceedings Paper
https://doi.org/10.1109/IRPS48227.2022.9764469
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dc.contributor.authorTsiara, Artemisia
dc.contributor.authorLesniewska, Alicja
dc.contributor.authorRoussel, Philippe
dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorBerciano, Mathias
dc.contributor.authorSimicic, Marko
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorCroes, Kristof
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorLesniewska, Alicja
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorBerciano, Mathias
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecLesniewska, Alicja::0000-0003-3863-065X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecBerciano, Mathias::0000-0003-0428-7005
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.accessioned2023-04-28T07:35:16Z
dc.date.available2023-02-27T03:27:55Z
dc.date.available2023-04-28T07:35:16Z
dc.date.embargo2022-03-31
dc.date.issued2022
dc.description.wosFundingTextThis work was supported by imec's industrial affiliation R&D program on Optical I/O. Authors would like to thank the participants of imec's Si Photonics Reliability Meeting and the members of the REL group for fruitful and stimulating discussions. In particular Laura Nuttin and Liese Hubrechtsen, MSc students from KU Leuven, for operational work in the BTS results.
dc.identifier.doi10.1109/IRPS48227.2022.9764469
dc.identifier.eisbn978-1-6654-7950-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41154
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
dc.source.journalna
dc.source.numberofpages7
dc.title

Degradation mechanisms in Germanium Electro-Absorption Modulators

dc.typeProceedings paper
dspace.entity.typePublication
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