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Reducing surface reflectivity below 10% by nano-features on random pyramid textured silicon wafers
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Reducing surface reflectivity below 10% by nano-features on random pyramid textured silicon wafers
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Date
2009
Proceedings Paper
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19257.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chan, BT
;
Gong, Chun
;
John, Joachim
;
Van Kerschaver, Emmanuel
;
Poortmans, Jef
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Abstract
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1834
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations
Metrics
Views
1834
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations