Publication:
Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography
Date
| dc.contributor.author | van Dael, M. | |
| dc.contributor.author | Verboven, P. | |
| dc.contributor.author | Zanella, A. | |
| dc.contributor.author | Sijbers, Jan | |
| dc.contributor.author | Nicolai, B. | |
| dc.contributor.imecauthor | Sijbers, Jan | |
| dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
| dc.date.accessioned | 2021-10-27T20:19:59Z | |
| dc.date.available | 2021-10-27T20:19:59Z | |
| dc.date.issued | 2019 | |
| dc.identifier.issn | 0925-5214 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34181 | |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0925521418300565 | |
| dc.source.beginpage | 218 | |
| dc.source.endpage | 227 | |
| dc.source.journal | Postharvest Biology and Technology | |
| dc.source.volume | 148 | |
| dc.title | Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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