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Articles
Test data volume comparison of monolithic testing vs. modular SOC testing
Publication:
Test data volume comparison of monolithic testing vs. modular SOC testing
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Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sinanoglu, Ozgur
;
Marinissen, Erik Jan
;
Sehgal, Anuja
;
Fitzgerald, Jeff
;
Rearick, Jeff
Journal
IEEE Design & Test of Computers
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1875
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Acq. date: 2025-12-15
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Metrics
Views
1875
since deposited on 2021-10-18
2
last month
2
last week
Acq. date: 2025-12-15
Citations