Publication:
SiO2/HfO2 MOSFETs after X-rays irradiation: impact on MOSFET performance and interface degradation
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2011 since deposited on 2021-10-15
Acq. date: 2026-01-09
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2011 since deposited on 2021-10-15
Acq. date: 2026-01-09
Citations