Publication:
SiO2/HfO2 MOSFETs after X-rays irradiation: impact on MOSFET performance and interface degradation
Date
Loading...
Journal
Abstract
Description
Metrics
Views
2010 since deposited on 2021-10-15
423item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2010 since deposited on 2021-10-15
423item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations