Experimental calibration of the temperature dependence of the heterojunction bandgap in III-V tunneling devices

dc.contributor.author	Bizindavyi, Jasper
dc.contributor.author	Verhulst, Anne
dc.contributor.author	Smets, Quentin
dc.contributor.author	Soree, Bart
dc.contributor.author	Groeseneken, Guido
dc.contributor.imecauthor	Bizindavyi, Jasper
dc.contributor.imecauthor	Verhulst, Anne
dc.contributor.imecauthor	Smets, Quentin
dc.contributor.imecauthor	Soree, Bart
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.orcidimec	Bizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimec	Verhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimec	Smets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimec	Soree, Bart::0000-0002-4157-1956
dc.contributor.orcidimec	Groeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned	2021-10-27T07:37:01Z
dc.date.available	2021-10-27T07:37:01Z
dc.date.issued	2019
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/32561
dc.source.conference	77th Device Research Conference (DRC)
dc.source.conferencedate	23/06/2019
dc.source.conferencelocation	Ann Arbor, MI USA
dc.title	Experimental calibration of the temperature dependence of the heterojunction bandgap in III-V tunneling devices
dc.type	Proceedings paper
dspace.entity.type	Publication
Files
Publication available in collections:	Conference contributions