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The Impact of NiO Interlayers and Annealing on Pt/Co for SOT-MRAM

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dc.contributor.authorWijshoff, Michelle
dc.contributor.authorCarpenter, Robert
dc.contributor.authorTalmelli, Giacomo
dc.contributor.authorCouet, Sebastien
dc.contributor.authorScheerder, Jeroen
dc.contributor.authorJoris, Rikkie
dc.contributor.authorVan Bael, Margriet J
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorTemst, Kristiaan
dc.contributor.imecauthorWijshoff, Michelle
dc.contributor.imecauthorCarpenter, Robert
dc.contributor.imecauthorTalmelli, Giacomo
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorScheerder, Jeroen E.
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorTemst, Kristiaan
dc.contributor.orcidimecWijshoff, Michelle::0000-0003-3210-1992
dc.contributor.orcidimecCarpenter, Robert::0000-0003-0101-5952
dc.contributor.orcidimecTalmelli, Giacomo::0000-0001-7763-7008
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecTemst, Kristiaan::0000-0002-1377-5097
dc.date.accessioned2025-07-28T03:57:06Z
dc.date.available2025-07-28T03:57:06Z
dc.date.issued2025-JUL 22
dc.description.wosFundingTextThe authors thank the imec MRAM, MCA, lab and pline teams, Lucas Vandewalle for help with APT and Sergey Basov for help with SQUID magnetometry at KU Leuven. The authors acknowledge the financial support of the KU Leuven C14/24/110 program, from the FWO-FNRS Weave program (G0D7723N), and the Excellence of Science (EOS) program (40007563-CONNECT) as well as the financial support of the Research Foundation-Flanders (FWO) through Hercules projects ZW13_09 and AKUL1522.
dc.identifier.doi10.1021/acsaelm.5c00841
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45946
dc.publisherAmerican Chemical Society
dc.source.beginpage6994
dc.source.endpage7002
dc.source.issue15
dc.source.journalACS APPLIED ELECTRONIC MATERIALS
dc.source.numberofpages9
dc.source.volume7
dc.subject.keywordsATOM-PROBE TOMOGRAPHY
dc.subject.keywordsEXCHANGE BIAS
dc.subject.keywordsANISOTROPY
dc.subject.keywordsSYMMETRY
dc.subject.keywordsINPLANE
dc.title

The Impact of NiO Interlayers and Annealing on Pt/Co for SOT-MRAM

dc.typeJournal article
dspace.entity.typePublication
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