Publication:
The Impact of NiO Interlayers and Annealing on Pt/Co for SOT-MRAM
| dc.contributor.author | Wijshoff, Michelle | |
| dc.contributor.author | Carpenter, Robert | |
| dc.contributor.author | Talmelli, Giacomo | |
| dc.contributor.author | Couet, Sebastien | |
| dc.contributor.author | Scheerder, Jeroen | |
| dc.contributor.author | Joris, Rikkie | |
| dc.contributor.author | Van Bael Margriet J. | |
| dc.contributor.author | Fleischmann, Claudia | |
| dc.contributor.author | Temst, Kristiaan | |
| dc.contributor.imecauthor | Wijshoff, Michelle | |
| dc.contributor.imecauthor | Carpenter, Robert | |
| dc.contributor.imecauthor | Talmelli, Giacomo | |
| dc.contributor.imecauthor | Couet, Sebastien | |
| dc.contributor.imecauthor | Scheerder, Jeroen E. | |
| dc.contributor.imecauthor | Fleischmann, Claudia | |
| dc.contributor.imecauthor | Temst, Kristiaan | |
| dc.contributor.orcidimec | Wijshoff, Michelle::0000-0003-3210-1992 | |
| dc.contributor.orcidimec | Carpenter, Robert::0000-0003-0101-5952 | |
| dc.contributor.orcidimec | Talmelli, Giacomo::0000-0001-7763-7008 | |
| dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
| dc.contributor.orcidimec | Fleischmann, Claudia::0000-0003-1531-6916 | |
| dc.contributor.orcidimec | Temst, Kristiaan::0000-0002-1377-5097 | |
| dc.date.accessioned | 2025-07-28T03:57:06Z | |
| dc.date.available | 2025-07-28T03:57:06Z | |
| dc.date.issued | 2025 | |
| dc.description.wosFundingText | The authors thank the imec MRAM, MCA, lab and pline teams, Lucas Vandewalle for help with APT and Sergey Basov for help with SQUID magnetometry at KU Leuven. The authors acknowledge the financial support of the KU Leuven C14/24/110 program, from the FWO-FNRS Weave program (G0D7723N), and the Excellence of Science (EOS) program (40007563-CONNECT) as well as the financial support of the Research Foundation-Flanders (FWO) through Hercules projects ZW13_09 and AKUL1522. | |
| dc.identifier.doi | 10.1021/acsaelm.5c00841 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45946 | |
| dc.publisher | American Chemical Society | |
| dc.source.beginpage | 6994 | |
| dc.source.endpage | 7002 | |
| dc.source.issue | 15 | |
| dc.source.journal | ACS APPLIED ELECTRONIC MATERIALS | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 7 | |
| dc.subject.keywords | ATOM-PROBE TOMOGRAPHY | |
| dc.subject.keywords | EXCHANGE BIAS | |
| dc.subject.keywords | ANISOTROPY | |
| dc.subject.keywords | SYMMETRY | |
| dc.subject.keywords | INPLANE | |
| dc.title | The Impact of NiO Interlayers and Annealing on Pt/Co for SOT-MRAM | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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