Publication:
European Test Symposium Teams: an Anniversary Snapshot
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| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-5058-8303 | |
| cris.virtual.orcid | 0000-0001-7325-8836 | |
| cris.virtualsource.department | 8a303854-e9b4-460a-b79d-03df3b3c4394 | |
| cris.virtualsource.department | 52be9e5e-be21-4e16-bad5-1335c497e6fd | |
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| cris.virtualsource.orcid | 52be9e5e-be21-4e16-bad5-1335c497e6fd | |
| dc.contributor.author | Jenihhin, M. | |
| dc.contributor.author | Raik, J. | |
| dc.contributor.author | Jutman, A. | |
| dc.contributor.author | Cherezova, N. | |
| dc.contributor.author | Ubar, R. | |
| dc.contributor.author | Miclea, L. | |
| dc.contributor.author | Enyedi, S. | |
| dc.contributor.author | Ştefan, I. | |
| dc.contributor.author | Stan, O. | |
| dc.contributor.author | Corcheş, C. | |
| dc.contributor.author | Peng, Z. | |
| dc.contributor.author | Eles, P. | |
| dc.contributor.author | Drechsler, R. | |
| dc.contributor.author | Eggersglüß, S. | |
| dc.contributor.author | Fey, G. | |
| dc.contributor.author | Glowatz, A. | |
| dc.contributor.author | Tille, D. | |
| dc.contributor.author | Gielen, G. | |
| dc.contributor.author | Coyette, A. | |
| dc.contributor.author | Dobbelaere, W. | |
| dc.contributor.orcidext | 0000-0003-2899-7669 | |
| dc.contributor.orcidext | 0000-0003-1484-5162 | |
| dc.contributor.orcidext | 0009-0002-1292-8140 | |
| dc.date.accessioned | 2026-04-30T12:34:15Z | |
| dc.date.available | 2026-04-30T12:34:15Z | |
| dc.date.createdwos | 2025-10-11 | |
| dc.date.issued | 2025 | |
| dc.identifier.doi | 10.1109/ets63895.2025.11049652 | |
| dc.identifier.isbn | 979-8-3315-9451-0 | |
| dc.identifier.issn | 1530-1877 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59243 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | IEEE | |
| dc.relation.ispartofseries | Proceedings of the European Test Symposium | |
| dc.source.beginpage | 1 | |
| dc.source.conference | IEEE European Test Symposium (ETS) | |
| dc.source.conferencedate | 2025-05-26 | |
| dc.source.conferencelocation | London | |
| dc.source.endpage | 48 | |
| dc.source.journal | 2025 IEEE EUROPEAN TEST SYMPOSIUM, ETS | |
| dc.source.numberofpages | 48 | |
| dc.subject.keywords | ANALOG | |
| dc.title | European Test Symposium Teams: an Anniversary Snapshot | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2025-11-28 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-04-07 | |
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