Publication:
Testing of 3D chips: anything new under the sun?
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-18T18:49:13Z | |
| dc.date.available | 2021-10-18T18:49:13Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2010-03 | |
| dc.identifier.issn | 0740-7475 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17580 | |
| dc.identifier.url | http://www.computer.org/portal/web/dt/pansum-marapr10 | |
| dc.source.beginpage | 75 | |
| dc.source.issue | 2 | |
| dc.source.journal | IEEE Design & Test of Computers | |
| dc.source.volume | 27 | |
| dc.title | Testing of 3D chips: anything new under the sun? | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |