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Impact of technology scaling on substrate noise generation mechanisms

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dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorWambacq, Piet
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorDonnay, Stephane
dc.contributor.authorGielen, Georges
dc.contributor.authorDe Man, Hugo
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.date.accessioned2021-10-15T12:39:47Z
dc.date.available2021-10-15T12:39:47Z
dc.date.issued2004-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8508
dc.source.beginpage501
dc.source.conferenceProceedings IEEE Custom Integrated Circuits Conference - CICC
dc.source.conferencedate3/10/2004
dc.source.conferencelocationOrlando, FL USA
dc.source.endpage504
dc.title

Impact of technology scaling on substrate noise generation mechanisms

dc.typeProceedings paper
dspace.entity.typePublication
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