Publication:

GR-noise characterization of Ge pFinFETs with STI first and STI last process

Date

2016

Journal article

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Files

33867.pdf 1.2 MB

Author(s)

Oliveira, Alberto V.

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;

;

Agopian, Paula G.D.

;

Martino, Joao A

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;

Witters, Liesbeth

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Collaert, Nadine

;

;

Journal

IEEE Electron Device Letters

Metrics

1918 since deposited on 2021-10-23

Acq. date: 2025-12-11