GR-noise characterization of Ge pFinFETs with STI first and STI last process

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33867.pdf 1.2 MB

Author(s)

Oliveira, Alberto V.

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Agopian, Paula G.D.

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Martino, Joao A

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Witters, Liesbeth

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Collaert, Nadine

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Journal

IEEE Electron Device Letters

Metrics

1915 since deposited on 2021-10-23

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Acq. date: 2025-10-24