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Keel-edge height selection for improved multi-pinhole 123I brain SPECT imaging
Publication:
Keel-edge height selection for improved multi-pinhole 123I brain SPECT imaging
Date
2020-05
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Auer, Benjamin
;
Kalluri, Kesava
;
De Beenhouwer, Jan
;
Zeraatkar, Navid
;
Momsen, Neil
;
Kuo, Philip H.
;
Furenlid, Lars R.
;
King, Michael A.
Journal
Journal of Nuclear Medicine
Abstract
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2078
since deposited on 2021-10-28
413
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2078
since deposited on 2021-10-28
413
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations