Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Dopant/carrier profiling for ULSI
Publication:
Dopant/carrier profiling for ULSI
Date
1998
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Clarysse, Trudo
;
De Wolf, Peter
;
Trenkler, Thomas
;
Hantschel, Thomas
;
Stephenson, Robert
Journal
Future Fab International
Abstract
Description
Metrics
Views
1965
since deposited on 2021-10-01
Acq. date: 2025-10-24
Citations
Metrics
Views
1965
since deposited on 2021-10-01
Acq. date: 2025-10-24
Citations