Publication:

Automated quantification of dimensions on tomographic reconstructions of semiconductor devices

Date

2007
Proceedings Paper
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dc.contributor.authorKalio, Andre
dc.contributor.authorRichard, Olivier
dc.contributor.authorSourty, Erwan
dc.contributor.authorBender, Hugo
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.date.accessioned2021-10-16T17:02:16Z
dc.date.available2021-10-16T17:02:16Z
dc.date.embargo9999-12-31
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12382
dc.source.beginpage387
dc.source.conferenceMicroscopy of Semiconducting Materials XV
dc.source.conferencedate2/04/2007
dc.source.conferencelocationCambridge UK
dc.source.endpage390
dc.title

Automated quantification of dimensions on tomographic reconstructions of semiconductor devices

dc.typeProceedings paper
dspace.entity.typePublication
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